- Murmu, Peter P., Markwitz, Martin, Kennedy, John V., Chong, Shen V., Malone, Niall, Mori, Takao, Vyas, Himanshu, Kennedy, L. John, Rubanov, Sergey, Sathish, Clastinrusselraj Indirathankam, Yi, Jiabao
Effect of native defects on thermoelectric properties of copper iodide films
- Murmu, Peter P., Karthik, Varun, Chong, Shen V., Rubanov, Sergey, Liu, Zihang, Mori, Takao, Yi, Jiabao, Kennedy, John
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